Description

Master Your Conventional Transmission Electron Microscopy Skills

This comprehensive Test Bank is designed to accompany the 3rd edition of John C. Mills’ ‘Introduction to Conventional Transmission Electron Microscopy’. As a graduate student or researcher new to the field, you’ll appreciate the emphasis on experimental and computational methods to analyze CTEM observations.

What’s Inside?

• Interactive modules and Fortran source code on a supplementary website
• Crystallography and quantum mechanics fundamentals
• Microscope components and underlying theory
• Dynamical theory of electron scattering in solids
• Applications to perfect and defective crystals, electron diffraction, and phase contrast techniques

This Test Bank offers instant digital download and is ideal for instructors seeking a reliable study support tool.

Unlock Your Potential with This Test Bank

Benefit from the expert knowledge of John C. Mills, who drew from his lecture course at Carnegie Mellon University’s Department of Materials Science and Engineering. With this Test Bank, you’ll be well-prepared to tackle challenging CTEM concepts and applications.